Used BRUKER EACOPE #9316184 for sale

BRUKER EACOPE is a high-precision wafer testing and metrology equipment, which can be used to measure the thickness, layout parameters (such as x/y coordinates), and surface roughness of various types of wafers. The system features a wide range of sensor heads, which can be used to measure wafers of different shapes and sizes and with different surface characteristics. EACOPE utilizes advanced optical and laser metrology technologies, as well as proprietary optical algorithms to provide high precision measurements. The unit comes with a high-resolution digital microscope as well as advanced image processing algorithms for surface measurements. It also features an intelligent PC-based UI, which allows users to easily configure the machine and enter test parameters. Additionally, the tool has user-friendly software commands that allow users to easily monitor testing operations and analyze results. The asset is capable of running automated "faculty" and "eyeball" modes, which help to ensure the accuracy of results. BRUKER EACOPE features a broad range of functions that allow users to calibrate sensors and measure dimensions accurately and reliably in accordance with accepted industry norms. This includes the ability to measure various types of film thickness, from Sub-micron silicon nitride films to high-precision transparent film thickness, and layouts from 0.1mm to 6mm. The model also offers a variety of tools to check surface features and analyze roughness. The equipment is designed for both laboratory and production operations and is compatible with various industry-standard sensors and optics. It also features automated sensor and optics management, tooling calibration routines, and automatic (as well as manual) wafer handling options. The system is also designed to be easily integrated into an existing factory infrastructure and can be remotely operated from a computer or mobile device for increased flexibility. EACOPE unit is highly precise and reliable, making it an invaluable tool for wafer testing and metrology operations. The machine's advanced sensor heads, optical and laser metrology technologies, as well as intelligent PC-based UI, offer lab-grade accuracy while providing users with a large degree of control. Plus, its automated tooling and wafer handling capabilities make for an easy to use tool with minimal need for manual intervention. All these features make BRUKER EACOPE an ideal solution for a range of wafer metrology and testing applications.