Used BRUKER / SLOAN DEKTAK IIA #293615478 for sale

BRUKER / SLOAN DEKTAK IIA wafer testing and metrology equipment provides accurate and efficient measurements of the surface topography on semiconductor wafers, substrates, and other microelectronic components. The system utilizes advanced optical interferometry technology to measure high-aspect-ratio trenches, depths, and heights with a fast scan speed and precision. The Dektak BRUKER IIA is equipped with an enlarged optical chamber in order to facilitate wafer sizes from 50 to 200 mm. This unit supports large 200 mm wafers with 10 µm positional accuracy and features full software control of wafer position, autofocus and recessed wafer tilt adjustment. The Dektak SLOAN DEKTAK IIA features an intuitive graphical user interface that controls the scanning process. The user interface provides an easy-to-use menu machine for setting up the tool for measurement. The Dektak IIA also includes asset alignment procedures and a variety of data analysis tools that ensure measurements are fast and accurate. With a Standard Resolver Calibration feature, users can easily select the best measurement resolution settings for their application. The Dektak BRUKER / SLOAN DEKTAK IIA supports full wafer mapping with its advanced multi-coordinate cross-sectioning and extended scan functions. This feature enables users to measure down to 3-dimensional depth, height, and profile on the entire surface of a wafer. With its Automatic Height Optimization Software, the Dektak BRUKER IIA is able to automatically adjust the measuring head's height level to maintain consistent measurement results. Overall, SLOAN DEKTAK IIA wafer testing and metrology model is a powerful, accurate and reliable equipment for analyzing the surface topography of semiconductor wafers and other microelectronic components. With its intuitive graphical user interface, adjustable measuring head's height level, and a variety of data analysis tools, the Dektak IIA is well-suited for many different measurement applications.