Used BRUKER / SLOAN DEKTAK XT #9184680 for sale

BRUKER / SLOAN DEKTAK XT is a wafer testing and metrology equipment for measuring the height, thickness, area, and other relevant characteristics of wafers and thin film samples. The system consists of a high-speed, high-resolution non-contact stylus profiler, a large-scale Area Measurement Head (AMH) for large-area flatness mapping applications, and an optional low-tilt head for mapping the flatness of limited-area flatness measurements. The profilometer includes linear and rotary axes for accurate control of the scanning parameters. The main measurement head is a non-contact piezoelectric transducer that enables easy and reliable operation. BRUKER XT is designed for the reliable, accurate, and repeatable measurement and mapping of complex surface topography on a variety of substrates. The unit includes color-coded manual and automated measurement stages, which can be configured to a multitude of formats allowing for a range of application possibilities. Its user-friendly and intuitive software provides a large variety of analysis and data display options for intuitive data manipulation. The machine includes an automated step/jump profile to navigate a sample in either a linear or radial pattern, enabling the measurement of a smooth profile. SLOAN DEKTAK XT also features several optional accessories that are designed to enhance the measuring performance of the tool. These include a star auto-focusing device for high-accuracy z-positioning, and an optional vibration table to measure on vibrating samples. The asset also offers a wide range of equipment for temperature-controlled measurements, including an oven, Peltier supply, lamp power supply, acoustic quartz-vibration isolation base, and a magnetic field calibration kit. XT is accurate, reliable, reproducible, and has been designed as an easy-to-use measuring instrument for total process control. It is ideal for quality assurance and research applications within the semiconductor, electronics, data storage, biotechnology, glass, and materials industries. The DEKTAK BRUKER / SLOAN DEKTAK XT features non-contact stylus measurements with low-noise drift characteristics that provide smooth, reliable data with traceable results. These characteristics make it an ideal tool for accurate and repeatable measurements of small-scale, critical features that are otherwise difficult to measure using standard scanning-electron microscopes.