Used FARO Gage Plus #9411668 for sale

FARO Gage Plus is a wafer testing and metrology equipment designed to accurately measure, inspect and compare wafer performance over time. This next generation non-destructive characterizing and defect detection system features advanced 3D point cloud wafer mapping combined with support for large wafer sizes up to 300 mm. Additionally, the unit can rapidly acquire and analyze high resolution images with different levels of magnification (x10-x1000) and detailed depth information to detect flaws, defects and particles. Using advanced algorithms of its automated defect classification feature, Gage Plus can accurately identify, sample and measure defects and microstructure characteristics ranging from 0.1 um to 25mm, making it one of the most comprehensive metrology solutions currently available for wafer testing and metrology. The machine contains a high speed measurement pallet capable of simultaneously measuring 500 wafers per hour making it suitable for batch testing processes. Additionally, FARO Gage Plus is equipped with embedded software and automated measurement platforms designed to prevent operator errors, speeding up the process even further. By incorporating powerful software, advanced algorithms, and multi-axes laser calibration, Gage Plus provides repeatable and reliable results. This provides higher performance than traditional inspection systems and enables optimized workflows for pattern alignment, defect mapping and particle analysis. FARO Gage Plus is an advanced metrology tool for wafer testing and metrology. It features a high speed measurement pallet and automation capabilities allowing for rapid and accurate measurements of wafers up to 300 mm. It enables users to simultaneously inspect and analyze high resolution images with its automated defect classification feature. Furthermore, multi-axes laser calibration and its embedded software help promote repeatable and reliable results, making it an ideal choice for customer looking for a comprehensive and reproducible testing solution.