Used FEI DA300 #9257394 for sale

FEI DA300 is a high performance wafer testing and metrology equipment that utilizes integrated technologies to increase efficiency, accuracy and productivity while reducing cost and cycle time. The system is designed to test up to 300mm wafers using its range of advanced sensors, analyzers and inspection systems. With its precision optics, DA300 delivers accurate and repeatable results across a wide range of wafers and device types. FEI DA300 uses an integrated optical inspection unit to detect various anomalies on the wafer surface, such as micropipes, anomalies, particles and process anomalies. It can also identify material composition, layer composition and film thickness. Furthermore, it can detect latent defects and hidden process defects. With its high resolution imaging capabilities, DA300 can differentiate between different types of wafer properties and defects. In addition to optical inspection, FEI DA300 has a number of other tools for wafer testing and metrology purposes. Its non-contact resistivity and capacitance measurements enable accurate parameters of electrical and RF devices. Its wide-angle scattering mapping machine measures nanoscale critical dimensions and profiles of microelectronic structures as well as formation and patterning characteristics of coatings. Its optical and electrical analyzers allow for in-depth analysis of device features and can detect defects that may be difficult to detect using conventional microscope techniques. DA300 is designed to provide users with a comprehensive set of features and functions. Its automated test routines reduce the time and effort required to perform inspections, making it an ideal tool for efficient and cost-effective wafer testing and metrology. Furthermore, it supports a wide range of interface and automation requirements, making it compatible with a variety of data formats. As well as providing users with data-rich reporting and on-screen diagnostics to enable detailed analysis and optimization of processes. FEI DA300 wafer testing and metrology tool is a highly advanced, fast and reliable solution for wafer testing. It is a versatile and feature-rich asset that combines a suite of sensors, analyzers and inspection technologies to enable efficient and accurate wafer testing. Capable of delivering detailed data on a range of devices, it is an ideal tool for a variety of applications across a range of device types.