Used FEI DA300 for sale
Have one to sell?
Submit for sale
5
results found
Filters
Clear All
Filters
5 results
Wafer Size
-
(3)
Vintage
-
(2)
-
(1)
-
(1)
-
(3)
Popular Product
FEI
DA300
Defect analyzer, 12" NG Scanning Electron Microscope column (SEM) Detectors: ETD, TLD, CDEM Sidewind
39
Can't find what you are looking for?
Popular Product
FEI
DA300
Dual beam Scanning Electron Microscope (SEM), 12" Upgraded to SEM and FIB columns Electron NG SEM SF
91
