Used HITACHI PD 2000 #293820661 for sale

HITACHI PD 2000 is a wafer testing and metrology equipment designed for semiconductor manufacturers to achieve optimal process control and support yield management. It is a high speed, precision wafer surface inspecting system that can be used to measure topographic features on wafer surfaces more accurately than traditional methods. At the core of the unit is the optics; an optical microscope with automated XY scanning stage and a spectral illumination LED. With this, the machine is able to view the surface from different angles and measure the heights of various features accurately by determining their shade and intensity. Additionally, HITACHI PD-2000 is also capable of 3D imaging, and it can display topography ultra-low-roughness maps to reveal line-edge effects more accurately. Other features of the tool include a high-speed measurement mode, which can scan a 150mm wafer in less than 50 seconds; a full auto-calibration asset which can properly adjust the measurement conditions and ensures the accuracy of the results; and an automatic defect-notification model, which can help reduce inconvenience from manually tagging amount of defects. PD 2000 also provides a comprehensive software package, which can support analysis of the three-dimensional image and comment on the data pattern, as well as interface with the existing SEMI MES and SCADA systems for integration into the customer's existing equipment. In conclusion, PD-2000 offers high speed, reliable, precise, and accurate wafer surface measurement with the capability for three dimensional imaging. This system offers great value to semiconductor manufacturing companies in terms of optimizing process control and providing timely feedback on errors, faults, and defects.