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Marketplace
Wafer Testing And Metrology
HITACHI
PD 2000
Used HITACHI PD 2000 for sale
Wafer Testing And Metrology
Manufacturer
HITACHI
Model
PD 2000
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results
Vintage
1989
(1)
1988
(1)
Popular Product
HITACHI
PD 2000
Scanning Electron Microscope (SEM) 1988 vintage.
91
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Popular Product
HITACHI
PD 2000
Wafer particle inspection system 1989 vintage.
194
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