Used KLA / TENCOR / PROMETRIX 6200 Surfscan #293621540 for sale

KLA / TENCOR / PROMETRIX 6200 Surfscan is a wafer testing and metrology equipment that offers comprehensive testing capabilities and high accuracy. The system is designed to provide users with vital data which is used to optimize product performance and minimize yield loss. KLA 6200 Surfscan unit boasts superior performance, with a patented co-alignment, dual laser machine and superior optics providing superior wafer alignment, axial and radial measurements accurate to within 5 microns across a range of die sizes, pitch sizes and orientations. The tool is also capable of performing 400+ full field measurements per second. The asset provides robust process control via the EikonixPegasus metrology control software, which allows users to set specific parameters and perform comprehensive field, linear, 1D and profile measurements. The software also offers powerful analysis tools for advanced process capability and yield analysis. TENCOR 6200 Surfscan model provides a suite of wafer probing capabilities to meet the needs of the most challenging processes and applications. Its vector probing and die recognition capabilities allow for improved defect detection, enhanced yield analysis and accelerated data analysis. The unit also offers industry leading measurement throughputs with a maximum (100mm) sensitivity of up to 2000 fields per second with no additional alignment time, while providing a full suite of OPC measurements including high and low voltage, HSOT and E-Beams. The equipment also offers 3D Critical Dimension (3DCMAD) measurements, a technology which enables the measurement of metallic films and imaging of features below the diffraction limit. 6200 Surfscan has a maximum measurement speed of 1 field per second and it is ISO and SEMI compliant. In summary, PROMETRIX 6200 Surfscan system is a state-of-the-art wafer testing and metrology unit that offers users robust process control and fast, accurate measurements. Its advanced technologies and expansive range of probing capabilities make it ideal for use in a wide range of semiconductor testing applications.