Used KLA / TENCOR / PROMETRIX 6200 Surfscan #9234557 for sale

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KLA / TENCOR / PROMETRIX 6200 Surfscan
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ID: 9234557
Wafer Size: 4"-8"
Automatic surface inspection system, 4"-8" Sub-micron sensitivity defects: 0.10 Micron particles Color codes defect maps, histograms & other graphics Instantaneous magnified 3-D views of individual defects Surface haze detection Laser type wavelength: Argon 488 30 mW Particle sensitivity: 0.10 um at 95% Measurement range: 0.09-9999 um Haze sensitivity resolution: 0.05 ppm Repeatability: 0.5% at 1 standard deviation Throughput: 150 wph on 6" wafer.
KLA / TENCOR / PROMETRIX 6200 Surfscan is a high-performance wafer testing and metrology equipment designed to provide precision results in a variety of specialized wafer applications. Utilizing a laser confocal technology, KLA 6200 Surfscan provides extremely accurate measurements of the physical characteristics of integrated circuit wafers, particularly in terms of thickness, roughness, and texture. TENCOR 6200 Surfscan system is equipped with two high-resolution color cameras that allow the operator to monitor the waffers under test, and the unit can also detect and measure non-uniformity across the entire wafer surface. 6200 Surfscan is also capable of measuring surface characteristics of non-IC wafers (such as optical or microelectromechanical systems) with high precision. PROMETRIX 6200 Surfscan machine has a dual-stage, automated scanning head that enables high-throughput sample preparation and ensures accurate measurement at all levels of speed. The tool is designed to provide scan rates up to 800 samples per hour and has a maximum scan speed of 20 inches per second. KLA / TENCOR / PROMETRIX 6200 Surfscan offers a wide variety of advanced features, including automated calibration, latency compensation, field mapping, and integrated conditioning, making it a highly reliable asset. KLA 6200 Surfscan's software suite includes advanced data analysis methods, including areal and line profiling, peak/valley measurement, grain amplitude/orientation analysis, and autoscaling/automatic-plotting features. Additionally, its software offers a contamination monitoring feature, providing real-time feedback on the levels of contaminants present on the wafer surface. TENCOR 6200 Surfscan also comes with comprehensive diagnostic capabilities, allowing for the quick and efficient troubleshooting of any model errors that may arise. Finally, the equipment is backed by exceptional customer support, offering guidance and advice to ensure that customers get the most out of their systems. 6200 Surfscan is a powerful and reliable system that offers the highest possible accuracy in the inspection of samples for wafer production. It is an ideal solution for those seeking a comprehensive and reliable solution for measuring the physical characteristics of their critical applications.
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