Used KLA / TENCOR 6420 Surfscan #293624109 for sale

KLA / TENCOR / PROMETRIX 6420 Surfscan is a wafer testing and metrology equipment designed for the characterization of flat, free-standing wafers and circuit assemblies in the semiconductor industry. It is capable of accurately measuring the surface topology and flatness of many different materials, including silicon, gallium arsenide and quartz. KLA 6420 Surfscan system consists of a metrology head, a test stand, and a variety of hardware and software options, making it one of the most versatile wafer testing and metrology systems available. The metrology head is mounted on a vertical stage, which is driven by a precision, brushless gimbal motor. The unit also includes a flexible optical specular reflectometer, an interferometer, an x-ray diffractometer, a scatterometer, and an x-ray surface imaging camera. These components can measure the physical characteristics of surfaces, including surface roughness, flatness, defects, and other topological details to a resolution of 0.5 nanometres or better. In addition to its physical surface measurement capabilities, TENCOR 6420 Surfscan machine offers a variety of software options. These include multi-channel image analysis for automated defect detection, statistical analysis for surface characterization and trend monitoring, and interactive 3D displays for virtual prototyping. In addition, the tool can be used for failure analysis and product evaluation, with its advanced software allowing for the easy comparison of data from multiple sites. 6420 Surfscan asset is a valuable tool for process monitoring and yield improvement development. Its precision measurement capabilities make it ideal for advanced quality control applications, such as monitoring dimensions, surface defects, and feature-to-feature registration. It is also capable of generating accurate, detailed reports in a variety of formats, allowing users to quickly analyze results and make informed decisions. Overall, PROMETRIX 6420 Surfscan model is an incredibly powerful metrology device that is capable of analyzing and reporting accurate surface measurements and trends with great precision and speed. It is an ideal choice for semiconductor manufacturers looking to ensure their products meet quality and reliability standards.