Used KLA / TENCOR 6420 Surfscan #293706991 for sale
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ID: 293706991
Wafer Size: 2"-8"
Vintage: 1996
Particle inspection system, 2"-8"
Substrate thickness: 12 mm
Single puck handling from single cassette or platform
Defect sensitivity surface: 0.12 µm
Defect sensitivity polished silicon: 0.12 µm at 95% capture rate
Operating system: Windows 98
Illumination source:
Argon-Ion laser: 30 mW
Wavelength: 488 nm
1996 vintage.
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