Used KLA / TENCOR 6420 Surfscan #293767198 for sale

KLA / TENCOR 6420 is a state-of-the-art wafer testing and metrology equipment developed by KLA Corporation. It is designed to provide accurate, reliable metrology and wafer level testing solutions for manufacturers in the semiconductor and photovoltaic industries. KLA 6420 system consists of a high-resolution, high-throughput digital imaging unit, automated sample loading, and a suite of custom-developed metrology software that allows for high speed, high fidelity analysis of wafers. The machine combines high throughput, high accuracy, and high data acquisition and analysis capabilities to quickly identify topological defects, detect and map contaminants and particles, and to create cross-sectional views of features and defects in wafers. TENCOR 6420 tool uses a sophisticated imaging asset to collect data from up to 64 wafers at once, and then processes the data with its specialized metrology software. This software can perform sophisticated analysis of the data and generate detailed 3D images of the wafer for inspection and evaluation. Additionally, the model includes powerful, multitasking capabilities that can perform a variety of operations in parallel. 6420 equipment also includes a comprehensive suite of software applications designed to maximize productivity in the production environment. This software interface has been designed to be user-friendly, allowing operators to quickly adapt to the system and increase their productivity while also providing functionality that is tailored to the specific needs of the user. At the core of KLA / TENCOR 6420 unit is TENCOR E-Metrology Machine software, a powerful combination of algorithms, data storage, and analysis capabilities that integrate seamlessly with the entire suite of KLA / TENCOR metrology and analysis equipment. This powerful combinational software allows for unprecedented levels of accuracy and repeatability when inspecting and analyzing wafer topology, scanning for particles and contaminants, determining subtle gradients, and precisely measuring and mapping features on the wafer. KLA 6420 is one of the most advanced wafer testing and metrology systems available and combines the latest man-made technologies with the highest level of precision and accuracy. It is designed to provide the foundations for a comprehensive, accurate, and reproducible semiconductor device fabrication process. It is a highly reliable and productive tool, ideal for a wide range of device manufacturers who require the highest level of performance and analysis.