Used KLA / TENCOR / PROMETRIX 6420 Surfscan #9287171 for sale

KLA / TENCOR / PROMETRIX 6420 Surfscan
ID: 9287171
Measurement system.
KLA / TENCOR / PROMETRIX 6420 Surfscan is a state-of-the-art wafer testing and metrology equipment. It is designed to provide accurate and reliable surface measurement of a variety of wafers, including gallium arsenide, indium phosphide, and silicon-on-insulator. KLA 6420 Surfscan combines advanced optics with advanced electronics and motion control to produce a high precision, non-destructive optical system for measuring surface topology, feature size, and surface profile. TENCOR 6420 Surfscan is equipped with a chromatic confocal sensor which utilizes a 532 nanometer (nm) laser to provide high-resolution images. The combination of the laser and the sensor produces a highly accurate three-dimensional image of the wafer's surface. This image serves as the basis for precise surface measurements that includes feature size, depth, and surface roughness. PROMETRIX 6420 Surfscan also features a customizable software suite that allows users to configure test parameters for precise wafer measurements. This makes it easy to optimize the user's testing requirements and to obtain the most accurate results. The software comes with a selection of pre-loaded settings, as well as an array of advanced features that allow users to tailor the testing to specific needs. The unit also comes with an integrated environmental control machine that helps maintain a consistent temperature and humidity level in the testing environment. This ensures the accuracy of the results, regardless of the environmental conditions. In addition, 6420 Surfscan also features a high accuracy linear cross-slide stage that can accommodate wafers of up to 12 inches in diameter. KLA / TENCOR / PROMETRIX 6420 Surfscan is a highly advanced wafer testing and metrology tool that offers a host of features and benefits. Its powerful software, highly accurate imaging asset, and integrated environmental control model makes it an invaluable tool for accurately and reliably measuring wafer surfaces.
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