Used KLA / TENCOR / PROMETRIX 6200 Surfscan #9262110 for sale

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ID: 9262110
Inspection system.
KLA / TENCOR / PROMETRIX 6200 Surfscan is a wafer testing and metrology equipment designed to meet the needs of semiconductor manufacturers. The system provides advanced features and increased throughput for efficient wafer testing and analysis. The unit is comprised of an high resolution Profiler imaging machine and a Contour Scan 1250 coordinate measurement station. The profiler tool is capable of measuring features on both single-sided and double-sided wafers with resolutions of up to 0.25 microns. The contour scan 1250 station is capable of measuring to a resolution of up to 1 micron. The asset features advanced surface feature recognition and high-speed data acquisition. It is capable of measuring surface features faster and with higher accuracy compared to traditional wafer inspection technologies. The model also offers improved wafer throughput and inspection speeds by utilizing multiple sensors and automated data analysis. It also has the ability to interpret feature trends in order to determine where in the fabrication process anomalies may occur. The equipment features various custom analysis tools such as Varian Well Connected for simultaneous analysis of gates, active areas, and well boundaries on the same wafer. The system is also equipped with wafer mapping functions to track process-induced changes to device structures, as well as automated defect detection. The unit supports both manual and automated operation for maximum flexibility. It has an intuitive user interface, allowing users to quickly and easily perform various analytical tasks. Additionally, the machine supports integration with other process control systems to ensure continuous operation. KLA 6200 Surfscan is an ideal tool for semiconductor manufacturers who require accurate wafer testing and analysis without compromising speed or throughput. With its advanced feature recognition, high-speed data acquisition, process monitoring, and automated defect detection, the tool provides a cost-effective solution that improves yields and increases productivity.
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