Used KLA / TENCOR / PROMETRIX 6200 Surfscan #9293247 for sale

KLA / TENCOR / PROMETRIX 6200 Surfscan is an advanced wafer testing and metrology equipment. Equipped with advanced software algorithms, it is capable of high-speed, high-precision non-contact measurements of wafer surfaces and structures. The system is capable of measuring a wide variety of features such as flatness, size, shape, depth, profiles, surface topography, and even defect characterizations. KLA 6200 Surfscan is equipped with a precision motion stage unit that is capable of precise control and positioning of the wafer. This machine includes a high-speed XY-scanner as well as a rotary scanning mechanism for higher throughput. The rotary scanner enables measurement of angles from 0 to 360 degrees with a rotational accuracy of 0.02 degrees. The high scanning speed of the rotary scanner ensures accurate results. TENCOR 6200 Surfscan also features an advanced high-resolution digital video sensor and advanced optics to enable accurate measurements. This includes a wide range of magnification, with a maximum magnification of 1 micron for feature sizes of up to one micron. The tool also includes algorithms for automated edge detection and defect characterization. PROMETRIX 6200 Surfscan is specifically designed to provide accurate measurements of mass-produced electronic devices and components including die casting, resins, and plastics. The asset is equipped with a range of data analysis options, including histogram analysis, line scans, particle analysis, and 3D topography reconstruction. Furthermore, 6200 Surfscan also features a fully automated data acquisition model, which enables measurements to be uploaded, stored, and shared with other systems in real-time. This means that the data can be analyzed in real-time without the need for manual input. KLA / TENCOR / PROMETRIX 6200 Surfscan is reliable, highly accurate, and easy to use. It provides users with a wide range of options for data analysis and offers a cost-effective solution for wafer testing and metrology.