Used KLA / TENCOR / PROMETRIX 6200 Surfscan #9410475 for sale

KLA / TENCOR / PROMETRIX 6200 Surfscan is a wafer testing and metrology equipment that offers precise, high-resolution measurements for a wide range of technologies. The system consists of a wafer testing head, which is connected to a controller station. The testing head contains the optical and electrical head, which houses the optical and electrical components necessary for sample testing. The controller station is equipped with software that allows users to customize their parameters for sample testing. KLA 6200 Surfscan is designed for both research and production use, offering precise measurement capabilities for imaging, metrology, and defect detection. The unit offers versatile optical, electrical, and mechanical components for precise wafer measurement. The innovative optics and powerful lighting systems provide high-resolution imaging and precise 3D measurements, even in applications that require precise position alignment. Additionally, the machine is capable of variable speed scanning, allowing users to customize their test cycles according to specific requirements. The Surfscan 6200 is capable of diverse testing capabilities, including automated defect review, CD uniformity and flatness measurements, particle and foreign material inspection, spectral measurements, and much more. The tool also offers automated testing, which quickly and accurately evaluates a variety of process parameters and result trends. In addition, the asset allows users to set up and store local and remote process parameters, making data collection and analysis more efficient. TENCOR 6200 Surfscan also comes with process control and planning capabilities, allowing users to plan, analyze and control their process operations in a more efficient manner. The model also offers extensive data logging and reporting capabilities for analysis, which makes it easier for engineers to troubleshoot and research their processes. Overall, PROMETRIX 6200 Surfscan is an accurate and versatile wafer testing and metrology equipment that is capable of providing precise measurements in a wide range of applications. The system is designed for both research and production use, making it ideal for a variety of applications. The unit's automated testing and reporting capabilities make it easier for engineers to troubleshoot and research their processes while providing precise measurements and reliable data.