Used KLA / TENCOR / PROMETRIX 7600 Surfscan #293594317 for sale

KLA / TENCOR / PROMETRIX 7600 Surfscan
ID: 293594317
Wafer Size: 2"-8"
Particle inspection systems, 2"-8".
KLA / TENCOR / PROMETRIX 7600 Surfscan is a wafer testing and metrology equipment that enables fast, accurate and efficient testing of wafer surfaces. It is designed to detect even very minor imperfections and abnormalities on wafer surfaces, providing detailed and reliable insights into the wafer's production quality. The Surfscan 7600 features a non-contact measurement capability, which enables surface defect analysis in non-destructive manner, resulting in highly efficient sample to sample processing. The system utilizes the industry-leading Surfscan 7500 software platform to provide rapid, pixel-accurate measurements of a wide range of surface characteristics, such as step height, surface roughness, waviness and profile measurements. The included CCD Optical Profile and Pitch Measurement Unit provides fast, accurate measurements at an extremely high resolution, enabling the detection of even microscopic defects. The machine's scalable microscopy feature further enhances the precision of the measurements, allowing visual inspection and review without the need for manual entry. The tool is also equipped with KLA Wafer Map Reporter, which provides real-time display of defect position and type. This enables faster analysis and minimizes data entry errors. Additionally, the integrated Defect Map Editor (DME) allows for automated generation of defect maps and microscope slides for further analysis and accurate composition of defect counts. Furthermore, the asset features automatic correlation between defect locations and chemical composition. This helps to separate false defects from genuine defects and provides a chemical fingerprint for the surface. This ensures greater accuracy and repeatability of results. KLA 7600 Surfscan is a powerful wafer testing and metrology model that is ideal for use in any wafer production environment. Its combination of integrated hardware and software, accuracy and speed, scalability, and automated defect analysis makes it a preferred choice for professionals in the semiconductor industry.
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