Used KLA / TENCOR / PROMETRIX 7600 Surfscan #9026258 for sale

KLA / TENCOR / PROMETRIX 7600 Surfscan equipment is a highly advanced wafer testing and metrology tool. It is used to inspect a variety of semiconductor wafers, including those used in modern technologies such as light emission displays, LEDs, lasers, and advanced applications. The system allows users to quickly analyze their wafers for any errors or faults that may affect their performance. KLA 7600 Surfscan incorporates powerful analysis capabilities which are optimized for the inspection and review of a range of parameters related to wafer quality. It offers multiple analysis modalities such as line defect detection, non-uniformity, and fuzziness. This unit also features an advanced optics scanning machine which allows for a fast and accurate inspection process. Furthermore, a defect inspection and review functionality is available with the tool, allowing users to detect and review defects and sub-surface features in their wafers. The asset also performs top-side image analysis with the view of recognizing flatness, circle shapes, bevel edges, and border marks. TENCOR 7600 Surfscan model features an intuitive and user-friendly HMI (Human Machine Interface) which provides users with easy access to a range of equipment settings and functions. This makes it simple for users to acquire images and to configure their analysis parameters. Furthermore, a wide selection of image analysis algorithms are available, allowing for an accurate defect detection process. To further optimize the performance of the system, a range of advanced calibration techniques are available. These include flatness calibration, as well as global and local traceology calibration. This ensures that the unit is able to accurately detect various types of defects and errors in wafers. Finally, 7600 Surfscan is supplied with a comprehensive application library. This library includes fault detectors, voltage contrast imaging, and numerous other tools to further enhance the performance of the machine. This ensures that users have the resources they need to quickly and accurately detect and fix any problems with wafers.