Used KLA / TENCOR / PROMETRIX 7600 Surfscan #9083818 for sale

KLA / TENCOR / PROMETRIX 7600 Surfscan
ID: 9083818
Wafer Size: 6"
Particle inspection system, 6".
KLA / TENCOR / PROMETRIX 7600 Surfscan is a wafer testing and metrology equipment designed for semiconductor fabrication. The system is designed to provide comprehensive automated defect detection and characterization of the surface of semiconductor wafers during the process of semiconductor fabrication. The Surfscan 7600 unit offers both spectral reflectometry and optical microscopy to accurately measure the surface topology and defects of a wide variety of materials used in the fabrication of semiconductor wafers. This machine is capable of quantifying the size, shape, location, and orientation of micron-sized defects and features. With the advanced detection capabilities of the tool, it can detect defects of 0.2 microns in size or smaller. The Surfscan 7600 is a reliable, state-of-the-art asset that is equipped with an intuitive user interface and several advanced features. The model features a built-in Windows 10 operating equipment, a 20-inch HD touchscreen LCD for direct interaction with the user, a high quality optical digital camera, and a compact light source for illumination and defect detection. The system is also built with a barcode reader, a motorized automated X-Y-Theta stage, and a fully automated sample identification unit. The Surfscan 7600 is designed to provide accurate and reliable surface topology mapping, defect detection, and characterization. It is a flexible machine that is capable of testing many different materials and special processes. The tool is capable of testing a wide range of materials such as silicon wafers, glass wafers, metals, dielectrics, and others. The asset has complete defect detection, identification and analysis capabilities. It is equipped with an array of powerful imaging and analysis tools, including sophisticated image processing algorithms and software for automated defect detection and classification. The Surfscan 7600 includes a comprehensive library of defect types, which can be used for effective defect recognition and classification. In summary, KLA 7600 Surfscan is a comprehensive wafer testing and metrology model. It offers advanced features and capabilities for testing the surface topology and defects on a wide variety of substrate materials used in the semiconductor fabrication process. It is capable of detecting micron-sized defects, providing accurate and reliable defect detection, and classification.
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