Used KLA / TENCOR / PROMETRIX 7600 Surfscan #9299452 for sale

KLA / TENCOR / PROMETRIX 7600 Surfscan is a wafer testing and metrology equipment that features an advanced technology platform to enable critical inspections, characterization and process control across a wide range of semiconductor and optoelectronic applications. The system is composed of two modules, the Scanning Electron Microscope (SEM) module and the Atomic Force Microscope (AFM) module. The SEM module offers high resolution imaging and automated measurements to enable in-depth analysis of wafer topography and surface defects. It can detect micron-level surface imperfections, as well as measure and analyze feature profiles such as step heights, edge roughness and center-line roughness. The AFM module operates in ambient and vacuum conditions to provide atomic-level resolution imaging with nanometer-level resolution. It can be used for the characterization of surfaces and nanostructures to support process development, production monitoring and failure analysis. KLA 7600 Surfscan is designed to streamline wafer metrology with its automated alignment, scanning, measurement and data analysis functions. The unit includes a fast, precise and secure wafer handling machine. It is equipped with a high-resolution color CCD camera and motorized XY stage that can quickly move the wafer to the desired positions with repeatable accuracy. The tool is also equipped with an automated lens changer and focus mechanism that can change the microscope objective lens to the most suitable setting to deliver higher analytical accuracy and repeatability. Additionally, TENCOR 7600 Surfscan includes a powerful data processing asset that can collect and analyze deliverable data with charting, editing and reporting capabilities. Overall, 7600 Surfscan is a powerful wafer testing and metrology model that combines advanced technology, secure wafer handling and sophisticated data processing to enable rapid and accurate defect analysis and failure analysis. This equipment can detect and characterize surface imperfections and nanostructures to enable critical process control for a wide range of semiconductor and optoelectronic applications.