Used KLA / TENCOR / PROMETRIX AIT I #9139695 for sale

ID: 9139695
Wafer Size: 6"
Defect inspection systems, 6".
KLA / TENCOR / PROMETRIX AIT I is a comprehensive wafer testing and metrology equipment designed to provide accurate and reliable measurements of wafers. The system is capable of performing non-destructive testing and measuring of both thin and thick wafers with minimal time and effort. The unit utilizes advanced techniques and algorithms to detect and identify defects ranging from surface features and micro-imperfections to crystallographic defects. It also contains a range of integrated software tools for analyzing and reporting wafer test results. At the core of the machine is the patented KLA Automated Inspection Tool (TENCOR AIT) which is specifically designed for wafer testing and metrology. PROMETRIX AIT uses differential imaging techniques to map surface features to within 3 nm accuracy, and its built-in advanced algorithms can detect and identify even the smallest defects. The tool also integrates advanced algorithms for automated optical metrology, allowing for fast and accurate measurement of the wafer shape and thickness. The asset also features KLA / TENCOR / PROMETRIX Micro Imaging Program (TMIP) which provides an easy-to-use user interface for conducting wafer tests. TMIP enables users to create custom defect-detection programs that can be tailored to the specific needs of their specific wafer testing application. These custom programs can then be automatically executed on KLA AIT, allowing for rapid and consistent wafer testing with minimal user intervention. TENCOR AIT model complements the TMIP user interface with a range of advanced statistical analysis tools. The equipment contains an integrated histogram engine that can generate powerful trend analysis and statistical reports. These reports allow detailed inferences to be made on the incidence of defects such as particle density or defect uniformity on the wafer surface. KLA AIT I is ideal for a range of wafer testing and metrology applications such as semiconductor device manufacturing, photolithography, and etching. The system is capable of providing extremely accurate results with minimal operator intervention, making it an invaluable tool in the production of high-quality wafers.
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