Used KLA / TENCOR / PROMETRIX AIT I #9277680 for sale

KLA / TENCOR / PROMETRIX AIT I is a leading wafer testing and metrology equipment that provides cutting-edge application and measurement tools to reduce the time and cost of test and measurement processes while improving the quality of results. The system includes highly advanced algorithms to analyze wafers of varying thickness and shape for defects and non-uniformity. The unit supports a variety of wafer metrology applications for various segments of the semiconductor industry, such as wafer-level engineering, process development, post-process engineering, yield optimization, and device characterization. KLA AIT I machine supports a variety of traditional wafer metrology techniques, such as focus-variation, step-height analysis and scanning electron and atomic force microscopies. It also supports advanced defect detection and analysis, including Critical Dimension (CD) etch depth, CD linewidth, via depth, edge diffraction and CD transmission. The tool consists of three parts: a test head, a metrology asset, and a measurement tool. The test head is a motorized wafer-holder designed to hold multiple wafers, allowing for precise alignment when measuring different devices. The metrology model includes a suite of software tools designed to analyze, monitor and optimize process operations. The measurement tool is an advanced CMOS camera that takes high-resolution images of the wafer, allowing for accurate and detailed defect detection and analysis. TENCOR AIT I equipment incorporates sophisticated image analysis algorithms, which enable it to detect and analyze even the smallest defects and uniformity issues on multiple wafers. The system also offers rapid wafer-level alignment and measurement of process variations, enabling quick and accurate decisions to be made about product quality and process optimization. Overall, AIT I is a comprehensive wafer testing and metrology unit that is designed to help minimize cost and increase efficiency. By combining advanced automated tools with high-performance imaging and image analysis, PROMETRIX AIT I machine enables wafer manufacturers to accurately and quickly identify defects and uniformity issues. This helps them to quickly optimize their processes for maximum performance and highest quality.