Used KLA / TENCOR / PROMETRIX AIT I #9278329 for sale

KLA / TENCOR / PROMETRIX AIT I is a state-of-the-art wafer testing and metrology equipment for advanced semiconductor wafer fabrication and research. It provides comprehensive inspection, measurement, and fabrication data quickly and efficiently, including both front-side and back-side wafer inspection. The system is designed to be highly reliable and accurate, ensuring maximum performance and the highest level of yield. KLA AIT I consists of an integrated unit of components including an inspection station, an image acquisition machine, an automated optical tool, and a data management asset. The inspection station is a custom-designed, multi-sensor, automated optical inspection platform that provides on-die static parametric testing, as well as dynamic parametric testing for different structures. The image acquisition model acquires and processes images of the wafers at a higher-resolution than standard resolution wafer examine systems. It can also detect defects such as scratches, cracks, pits, and other irregularities. The automated optical equipment provides a full suite of metrology capabilities, including wafer contouring, autofocus, radius of curvature, critical dimension (CD) measurements, and overlay. It also comes equipped with advanced navigational systems to help guide and monitor the operation of the system. The data management unit is highly reliable, with a comprehensive set of analysis and visualization tools that provide theoretical, real-time, and historical comparisons. Overall, TENCOR AIT I wafer testing and metrology machine is an efficient and reliable solution for the advanced semiconductor wafer fabrication and research. With its easy set-up and robust operation, it provides customers with the most comprehensive wafer inspection, measurements, and fabrication data available. By taking advantage of the latest technologies, it enables definitive and cost-effective solutions with an improved yield and quality over other methods.