Used KLA / TENCOR / PROMETRIX AIT I #9299885 for sale

KLA / TENCOR / PROMETRIX AIT I is a wafer testing and metrology equipment that utilizes advanced imaging and metrology technology to deliver high precision in-depth wafer defect detection and imaging. The device is a part of the Array Inspection Technology (AIT) portfolio, designed to meet the rigorous requirements of advancing applications such as MEMS (Micro-electromechanical Systems), power devices, whole wafer analysis, and other image-based defectivity applications. KLA AIT I system includes a fast laser scanner that utilizes high-precision stepper motors to scan the substrate with sub-micron resolution. This fast laser scanner is capable of enhancing 3D surface topography, multiple reflectance, and image sharpness. An advanced control unit controls the operation of TENCOR AIT I machine. AIT I tool also features state-of-the-art image processing and computational algorithms that are designed for fast and accurate wafer inspection and analysis. These algorithms are used to detect defects, such as bumps, scratches, and pits, on a wafer surface. The asset also features numerous advanced image processing techniques, such as adaptive thresholding, region merging, and gray-scale manipulation. These techniques enable the detection and quantification of both visible and hidden defects, which are essential for highly precise wafer inspection and metrology. PROMETRIX AIT I model also features a powerful advanced imaging equipment, which is capable of capturing wafer images with a higher precision than ever before. This innovative imaging system is capable of accurate interferometric measurements, which significantly enhance the wafer image's accuracy and resolution. Additionally, the unit features a powerful software-calibration program, which is used to generate accurate wafer profiles for automated data acquisition. KLA / TENCOR / PROMETRIX AIT I machine is designed to streamline process flows and minimize downtime, to provide faster product delivery cycles and reduce costs. The tool's robust user interface simplifies operator training and product maintenance. All the features of this asset can be integrated into the overall production and quality control processes to ensure reliable product integrity and functionality. KLA AIT I model is an indispensable tool for testing and metrology of semiconductor wafers and other high-precision applications. Its versatility and accuracy enable fast and reliable detection of defects, while its powerful imaging equipment ensures real-time inspection for high-precision measurements and analysis. This system is ideal for modern semi-conductor manufacturing, and a perfect fit for the needs of the ever-changing technology landscape.