Used KLA / TENCOR / PROMETRIX AIT I #9379558 for sale
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ID: 9379558
Wafer Size: 6"-8"
Vintage: 1997
Patterned wafer inspection system, 6"-8"
1997 vintage.
KLA / TENCOR / PROMETRIX AIT I is a wafer testing and metrology equipment that is designed to deliver maximum accuracy and speed while providing users with advanced detection and process control solutions. The system is an integrated optical and mechanical unit capable of automated inspection and testing of wafers up to 200mm in diameter. KLA AIT I's most advantageous feature is its ability to provide in-depth data with a very high level of accuracy. It utilizes a combination of illumination techniques such as darkfield, high-intensity light, and oblique to pinpoint critical defects down to the sub-micron level. The machine is versatile enough to detect a variety of feature dimensions such as size, shape, presence, and profile. Additionally, complex algorithms are employed to accurately identify and quantify defects on the wafers. TENCOR AIT I tool is programmed with specialized software to provide user with automated process control solutions. This software package is designed to provide users with enhanced detection capabilities and data consistency. It is capable of monitoring process phases and detecting any defects that may be due to specific process issues. It also provides dynamic control capabilities so users can adjust settings for process optimization. The asset also provides users with a variety of advanced metrology capabilities. It is compatible with a range of wafer testing and metrology probes, including eddy current, contact lithography, piezo-force, and sonic vibration. It is capable of measuring a wide range of feature types, from very small nanoscale features down to the micron level. It is also capable of rapidly detecting trends and taking corrective action when needed. AIT I uses a modern graphical user interface (GUI) to make the model easy to use and navigate. This helps to dramatically reduce operator training time and increase testing throughput. The intuitive interface enables users to quickly access test results, sort data, and customize test settings. In conclusion, PROMETRIX AIT I is an ideal wafer testing and metrology equipment for users looking for maximum accuracy and speed. Its combination of automated inspection, advanced process control, and metrology capabilities make it a great choice for wafer testing applications.
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