Used KLA / TENCOR / PROMETRIX Frame for RS-55 #293662988 for sale

KLA / TENCOR / PROMETRIX Frame for RS-55 is one of the most advanced wafer testing and metrology systems available on the market. It is used in the semiconductor industry, primarily for defect detection and analysis in the production of wafers. KLA Frame for RS-55 offers a feature-rich environment with its innovative hardware and software components. Its advanced optics platform is capable of high resolution wafer imaging and metrology. The system is designed to reduce the influence of optical aberrations in the images, allowing precise and repeatable measurements. It is also capable of providing user-selectable subpixel resolution, allowing greater accuracy of measurements. TENCOR Frame for RS-55 also includes a highly sensitive scatterometer, which helps to detect micro-defects with greater precision than traditional detection methods. This combined with its superior imaging capabilities makes it ideal for spotting contaminates, roughness, and other manufacturing defects. The R-System analytics software, which is fully optimized for Frame for RS-55, offers powerful defect analysis. Its automated processes and data acquisition features help reduce costs and ensure faster process times. It is able to detect and identify subtle defects at sub-wavelength resolution levels, providing greater accuracy and repeatability than manual methods. PROMETRIX Frame for RS-55 also includes a variety of advanced wafer handling systems, which reduce manual handling and improve throughput. Its automated solutions and integrated sensor systems provide a highly automated, one-stop solution for wafer test, metrology, and inspection. In conclusion, KLA / TENCOR / PROMETRIX Frame for RS-55 is one of the most advanced wafer testing and metrology systems available on the market. It offers a wealth of features designed to reduce cost and improve process speeds. Its powerful optical and imaging capabilities as well as its automated solutions ensure precise and repeatable wafer defect detection and analysis.