Used KLA / TENCOR / PROMETRIX FT-650 #293646045 for sale

KLA / TENCOR / PROMETRIX FT-650 is a state-of-the-art wafer testing and metrology equipment widely used in the semiconductor industry. KLA FT-650 features innovative optical imaging capabilities that enable rapid, non-contact measurements of a wide variety of metric values within a single product scan. The systems allow for quick and accurate testing and characterization of semiconductor compound materials, dielectric films, films with pinholes, metallic films and other thin-film materials on any substrate. TENCOR FT-650 offers several advanced features to optimize wafer testing, including multi-level datums, optical multiplexing, non-contact-based multi-channel topography measurement and automated pattern recognition. In addition, the optical setup of FT-650 system allows for the simultaneous measurement of several wafers across various locations on the unit. PROMETRIX FT-650 utilizes highly advanced 3-D optical microscopy systems to measure and analyze various microscopic features on the substrate. The 3-D optical images generated by KLA / TENCOR / PROMETRIX FT-650 can be further analyzed by the software's built-in advanced pattern recognition capabilities. This feature allows for exceptionally fast and accurate wafer identification and classification. The machine's high accuracy and repeatability make it suitable for thin-film metrology applications. KLA FT-650 is ideal for thin-film metrology applications such as thin-film characterization, wafer warpage measurement, film thickness measurement, and device characterization. With its high resolution images, TENCOR FT-650 tool enables users to accurately identify and characterize tiny features on the substrate. FT-650 asset's data output is user-friendly and compatible with various industry standard formats. PROMETRIX FT-650 provides users with the ability to export time stamped data for later review or for integration into third party metrology software packages. The collected data can be used for further analysis or in downstream product development processes such as Failure Analysis (FA) or Yield Improvement (YS). Overall, KLA / TENCOR / PROMETRIX FT-650 is an advanced wafer testing and metrology model designed to enable rapid and accurate measurements within a single product scan. With advanced features such as 3D optical microscopy systems, automated pattern recognition and data output compatibility with industry standard formats, KLA FT-650 is an invaluable tool for thin-film applications and analysis.