Used KLA / TENCOR / PROMETRIX M-Gage 300 #9151441 for sale

ID: 9151441
Metal film thickness meter system.
KLA / TENCOR / PROMETRIX M-Gage 300 is a wafer testing and metrology equipment designed to meet the most challenging demands in semiconductor test and metrology. It is used to measure dimensions of individual device features such as line widths, hole diameters, sidewall angles, and more, in a variety of semiconductor wafers. KLA M-Gage 300 features a customizable software programming platform that allows users to design their testing solution around their needs and the physical limitations of the system. The unit includes metrology software which enables users to accurately measure and analyze device features with high speed and precision. Additionally, TENCOR M-Gage 300 includes a high-precision, high-speed wafer stage, which is capable of handling a vast range of wafer sizes and materials. The machine also features an integrated probe head and a compact tool that is easy to integrate into existing inspection or test equipment. M-Gage 300 is capable of measuring features up to 2.75mm, with a resolution of 0.5 micrometers. The asset's accuracy is an impressive 0.03 micrometers. It operates at speed of up to 200 wafers per hour, and it uses advanced algorithms to detect various defects. The model offers a range of metrology settings, including a comprehensive set of wafer inspection parameters, such as particle size, tilt angle, and wafer edge assessment. PROMETRIX M-Gage 300 features an easy-to-use interface that allows users to set up tests quickly and is compatible with most PCs. It has an integrated networking capability and a full-color touchscreen interface, and it connects to peripheral devices for increased accuracy. The equipment can also be connected to a wide selection of peripheral devices for more advanced testing and analysis. KLA / TENCOR / PROMETRIX M-Gage 300 is a powerful wafer testing and metrology system that is designed to meet the toughest demands of semiconductor test and metrology. Its high accuracy, precision, and speed ensure that users get accurate, reliable and repeatable results every time. Additionally, its easy-to-use interface, wide compatibility and range of metrology settings, make this wafer testing and metrology unit a great choice for any semiconductor testing and metrology need.
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