Used KLA / TENCOR / PROMETRIX M-Gage 300 #9352954 for sale

KLA / TENCOR / PROMETRIX M-Gage 300 is a wafer testing and metrology equipment that combines innovative technologies and advanced software to give users the tools to rapidly analyze and inspect semiconductor wafers. The system offers unmatched speed and accuracy in wafer testing and metrology. Its unique modularity and scalability makes it highly flexible, allowing users to customize the unit to meet the specific needs of their application. KLA M-Gage 300 integrates multiple advanced metrology technologies into a single machine, offering comprehensive optical and acoustic microchip inspection. It is capable of analyzing a wide range of materials, including materials such as photoresists, metals, films, and more. This ensures reliable results for a wide range of applications, from wafer-level defect localization to topography measurements. The tool offers a host of advanced features that enable it to generate highly accurate results. These include a two-axis scanning stage for the quick and precise alignment of wafers, an advanced achromatic imaging asset, a unique hybrid microscope model, and high-accuracy wafer test patterns. In addition, TENCOR M-Gage 300 comes with a powerful suite of software, allowing for the rapid processing of large volumes of data. The equipment is extremely compact, and the low-profile design makes it ideal for cleanroom environments. M-Gage 300 is also highly intuitive to use, with an easy-to-use user interface and an intuitive workflow. Its advanced software integration ensures that data is quickly and accurately processed. This wafer testing and metrology system is a powerful and versatile solution for semiconductor wafer probing and analysis. It provides users with the tools and abilities to rapidly generate highly accurate results. Its scalability, modularity, and intuitive user interface ensures it is highly flexible and customizable to meet the specific needs of users.