Used KLA / TENCOR / PROMETRIX M-Gage 300 #9398265 for sale

KLA / TENCOR / PROMETRIX M-Gage 300 is a highly advanced, multi-functional wafer testing and metrology equipment. It is designed to meet the accurate and reliable requirements that are necessary for precision wafer fabrication. This system consists of a motorized platform, a high resolution imaging unit, and a broad range of integrated metrology software modules. For wafer testing applications, KLA M-Gage 300 offers a comprehensive array of electrical and optical probes for testing contact resistance, leakage current, die-to-die continuity, bonding defects, flatness, warp, and more. The motorized platform allows scanning measurements to be quickly and accurately completed, even on the most complex and challenging shapes. The high resolution imaging machine of TENCOR M-Gage 300 enables the inspection of very small features and enables the rapid acquisition of wafer images. This tool can capture multiple images of the wafer at different angles to accurately measure and compare tiny defects. The metrology software modules provide the user with the capability to automatically analyze the images acquired and rapidly produce comprehensive defect reports and comprehensive measurement results. M-Gage 300 has excellent repeatability and reproducibility and provides the user with a high level of confidence in their measurements. The easy-to-use graphical user interface allows the user to quickly begin testing, obtain measurements, and obtain defect reports. This asset is particularly useful for wafer testing and metrology applications in which complex and high accuracy measurements are necessary. In combination with the various automation features of PROMETRIX M-Gage 300, the model can be used to streamline the measurement process, increase throughput, and reduce data acquisition time. It is compatible with a large number of industry standard probes and software modules, making it an ideal solution for any testing and metrology application. KLA / TENCOR / PROMETRIX M-Gage 300 is a powerful and reliable wafer testing and metrology equipment that provides the user with precise and accurate information in need for reliable wafer testing and metrology applications. This system is capable of rapidly acquiring images and performing accurate and concise measurements while taking into account any manufacturing, component, and environmental conditions.