Used KLA / TENCOR / PROMETRIX Omnimap Auto RS-55/TC #293605691 for sale

KLA Omnimap Auto RS-55/TC is a wafer testing and metrology equipment designed for precision and high-accuracy measurement of advanced semiconductor devices. The system features a fast and efficient image acquisition unit, a customer-friendly user interface, and a wide range of analytical and measurement capabilities. The machine is capable of measuring device structures up to 25 nm in both planar and 3D structures. It provides high-resolution imaging and powerful process control, allowing for high-accuracy characterization of complex semiconductor devices. The Omnimap Auto RS-55/TC tool is based on a combination of optical reflectometry, scanning electron microscopy, and other technologies. The asset provides high-resolution imaging and powerful process control to enable rapid, high-accuracy measurement of current, voltage, and other electrical properties of advanced semiconductor devices. The model includes onboard processing tools such as device defect detection, 3D imaging, and wafer dispositioning. It also includes process control functions such as temperature control, imaging rate control, and variable imaging range. The equipment's user-friendly interface makes operations simple and efficient. This allows users to quickly attain high accuracy test data and process control. The system also features edge area mapping, process characterization, and data logging. Additionally, the unit provides advanced statistical analysis features to simplify data analysis. The Omnimap Auto RS-55/TC machine is ideal for customers who require a cost-effective solution for high-accuracy wafer testing and metrology. The tool is capable of operating in either an autonomous or semi-autonomous mode, making it a reliable and robust testing and metrology asset for both laboratory and production applications. It is designed to handle a wide range of device measurements, from simple resistors to complex logic devices. Overall, TENCOR Omnimap Auto RS-55/TC is a powerful, cost-effective wafer testing and metrology model. Its combination of high-accuracy testing, user-friendly interface, robust process control capabilities, and analysis tools make it an ideal choice for customers seeking a reliable, efficient wafer testing and metrology solution.