Used KLA / TENCOR / PROMETRIX Omnimap RS-100 #9174128 for sale

KLA / TENCOR / PROMETRIX Omnimap RS-100 Wafer Testing and Metrology Equipment is an advanced tool designed for the testing and characterizing of modern semiconductor devices. The system utilizes leading-edge optics, high-speed processors, and precise hardware to provide accurate measurements of device performance and reliability. The unit consists of an optimized optical measurement subsystem, a high-resolution imaging subsystem and a high-precision actuator subsystem. The optical subsystem includes a low-noise laser source, high-speed linear motor, and precise wafer quantitation algorithms. This enables accurate high-resolution profiling of wafers with low noise levels. The imaging subsystem includes a high-resolution camera, advanced image processing algorithms, and precise sample metrology tools. The actuator subsystem employs an array of micro-actuators and servo motors for high-speed material handling and precise motion control. KLA Omnimap RS-100 is capable of high-speed, highly-accurate wafer testing and metrology. It is equipped with advanced vision and measurement software, allowing for multiple programmable overlapping view points and settings. The machine has the ability to acquire and analyze thickness, critical dimension, surface roughness, and multiple material properties of the wafer in question. Using this information, yield information can be quickly determined, allowing quick pinpointing of microprocessing issues and root cause assessments. The tool also offers numerous additional features such as in-situ inspection, real-time visualization, customizable and upgradable probing technologies, and numerous other features for precise and reliable production quality control. The RS-100 also offers complete traceability and documentation capabilities, allowing total customer control over data and process metrics. TENCOR Omnimap RS-100 is a powerful and versatile asset that provides highly accurate measurements for semiconductor wafer testing and metrology. Utilizing its multiple subsystems, advanced vision and image processing algorithms, and precise motion control, the model offers reliable and repeatable results that can be used to drastically improve production and yield.