Used KLA / TENCOR / PROMETRIX Omnimap RS-35 #9192614 for sale
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KLA / TENCOR / PROMETRIX Omnimap RS-35 is a wafer testing and metrology equipment designed specifically to provide accurate measurements of wafer-level electrical properties. The system combines two highly reliable instruments in a single platform: an high-resolution imaging unit and a automated spin-stand. Working together, these two instruments allow for non-invasive, cost-effective and repeatable inspection and characterization of wafer-level integrated circuits (ICs), enabling detailed characterization of chip properties. The imaging machine used in KLA Omnimap RS-35 provides a high-resolution, full-field-of-view imaging capabilities with simultaneous measurement of many electrical parameters including voltage, current, capacitance and resistance. An automated stage and high-speed shutter are used to quickly scan and acquire images across different parts of the wafer. The imaging tool also features a wide array of optical filters that allow for enhanced sensitivity and selectivity of the imaging process. The automated spin-stand is an advanced piece of engineering used in TENCOR OMNIMAP RS35. It is capable of spinning the wafer at several different speeds, allowing for tilt/shift/rotation movements that are necessary for proper evaluation of the chip. The spin-stand is also equipped with a force-limited touchdown device, which allows for a repeatable, gentle contact between probes and tested points. The entire asset is designed to be compact and efficient, with a standard footprint that allows for integration with other processing platforms. Additionally, the model maintains a very low thermal signature and dissipates heat efficiently, resulting in minimal equipment heating and a reliable working environment. The system also features an array of connectivity options, allowing users to transfer data and image files quickly and easily to other systems. The combination of imaging unit and spin-stand make KLA OMNIMAP RS35 an industry leader in wafer testing and metrology. It provides a non-invasive and cost-effective method for measuring and characterizing chips, allowing for detailed knowledge of the electrical properties of individual chips. This makes the machine an excellent choice for a range of industries, from semiconductor manufacturing to integrated circuit design.
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