Used KLA / TENCOR / PROMETRIX Omnimap RS-35CA #9243618 for sale

KLA / TENCOR / PROMETRIX Omnimap RS-35CA wafer testing and metrology equipment is a reliable and powerful tool for analyzing process parameters of semiconductor materials. The system is built on a modular platform with newly designed software algorithms and software architecture. This platform enables faster data acquisition and analysis for faster decisions and turnaround. The unit can handle wafers up to 8 inches in diameter and has a working resolution of up to 6,000 x 6,000 pixels. The machine is also capable of testing various metal layers, oxide layers, and polysilicon layers. The tool is equipped with several key components, such as a number of LED pattern field external illuminators arranged in a scanning motion, an in-situ color CCD camera that captures images in a single snapshot, a high-speed signal processor to process digital images, and a high-resolution stepper motor that adjusts the sample height. Additionally, the asset includes a precision manipulator and probe for testing structures on the wafers. These components are integrated into a highly optimized closed-loop model that can accurately map structures on the wafer. Not only can the equipment accurately characterize the process parameters of the wafer, but the system can also make inspections of substrate surface defects. It is equipped with high-resolution vision modules that capture images of defects on the wafer surface. The unit can then accurately identify and measure any defect on the substrate surface, such as pitting, pinholes, protrusions, and scratches. The machine is also capable of handling different types of test substrates with different topography. For example, the tool can detect the difference in surface topology and accurately identify any features, such as steps, well edges, and other structures on the surface of the substrate. Additionally, the asset is also capable of performing rapid measurement of layer uniformity on highly structured substrates. The model can accurately measure the uniformity of thickness, surface roughness, and contamination. To sum it up, KLA Omnimap RS-35CA wafer testing and metrology equipment is an advanced and efficient tool for measuring and inspecting semiconductor materials. Its integrated components, such as an in-situ color CCD camera, digital image processor, stepper motor, and precision manipulator and probe enable the system to accurately measure and inspect wafer characteristics and identify defects. Thus, the unit is an invaluable tool for the semiconductor industry.