Used KLA / TENCOR / PROMETRIX Omnimap RS-35e #9188382 for sale

ID: 9188382
Vintage: 1991
Resistivity mapping system 1991 vintage.
KLA / TENCOR / PROMETRIX Omnimap RS-35e is a wafer testing and metrology equipment for inspecting complex patterned silicon wafers. It is designed to ensure the quality of the finished wafer. This system tests wafers across a large range of applications with high speed and precision. The RS-35e unit operates using scatterometry and coordinate measuring microscopy (CMM) technologies. This allows the machine to accurately measure feature dimensions and topography on patterned wafers. The tool is designed for use in semiconductor manufacturing, where manual examination of the patterned wafers is not possible under production-level throughput. The RS-35e asset uses a linear motor-driven model for accurate and high-speed testing of patterned wafers. This allows the equipment to attain maximum testing speeds while still providing accurate results. It is also equipped with a beam generator and detectors for performing scatterometry measurements on the wafers. This allows for measurements of sidewall angles, height, width, and area. The RS-35e system also includes an auto-focusing mechanism, which can adjust the focus for wafers of different sizes. This reduces the time required for testing and ensures accuracy for a variety of wafers. The unit has been designed to detect the surface defects of any given patterned wafer, ensuring the quality of the finished wafers. The machine includes advanced process control and fault diagnosis capabilities that can help identify any potential errors with the patterned wafers. It has analytical capabilities that can detect non-uniformity, defects, and trends, allowing for proactive maintenance and resolution of potential problems. The RS-35e tool is highly reliable and capable of testing patterned wafers with high precision and speed in an automated fashion. This asset is ideal for use in semiconductor manufacturing processes as it ensures the quality of the finished wafer and reduces time and cost associated with manual testing.
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