Used KLA / TENCOR / PROMETRIX Omnimap RS-55C #9362896 for sale

KLA / TENCOR / PROMETRIX Omnimap RS-55C is a comprehensive wafer testing and metrology equipment designed for high productivity and excellent quality measurements. It features a comprehensive suite of process characterization capabilities, such as resistivity, film thickness, and doping measurements, to characterize the electrical and optical properties of wafers. The system is powered by two scanning and metrology stages - a fully automated, semiautomated, and manual measurement station, which offer a wide range of wafer sizes, with a range from 200mm to 300mm. It also features a high-accuracy optical measuring unit, with sub-micron resolution for advanced wafer surface characterization. The RS-55C is equipped with an integrated low-vacuum and multi-gas switching for metrology and chemical vapor deposition. It also offers a built-in calibration routine, and comes with a standard set of third-party measurement optics. This ensures accurate and repeatable measurement results, and helps ensure that all measurement parameters are within stringent metrology standards. In addition, the machine also offers advanced photo-acoustic detection for measurement of the position of micro-features and structures on the wafer's surface for highly precise processing. It also offers integration with software such as LabVIEW, and an intuitive graphical user interface for easy control and monitoring. This helps streamline metrology and measurement operations and ensures precise, repeatable results. Overall, KLA Omnimap RS-55C offers a rich set of advanced features designed for excellent and reliable wafer testing and metrology. Its high-accuracy optical platform and state-of-the-art software make it an excellent choice for high-precision measurement of wafer attributes.