Used KLA / TENCOR / PROMETRIX Omnimap RS-55TC #293585881 for sale

KLA / TENCOR / PROMETRIX Omnimap RS-55TC wafer testing and metrology equipment is an advanced system designed to provide accurate and reliable measurements of Multiple Semiconductor Product Wafers. It is a fully automated film and defect inspection unit, capable of quickly and accurately inspecting multiple wafers simultaneously. KLA OMNIMAP RS-55/TC is built on a large CNC-enabled platform with a fully automated programmable and repeatable inspection process. The robust design, with integrated mechanical and electrical components, allows for reliable and repeatable testing of wafers of different shapes and sizes. The integrated high-speed scan optical machine provides the highest quality visualization. The wide field of view and high resolution enables fast and accurate detection of microscopic defects. It is equipped with multiple sensors including transmitted light, transmission infrared, scanning electron microscopy and ultra-clone probes, enabling rapid mapping and analysis of defects. The automated tool also integrates a metrology asset. It is capable of accurately measuring and mapping parameters, such as width, height, depth, stress, strain and TVD using non-contact, non-destructive techniques. The intuitive user interface and powerful software makes it easy to set-up, measure and analyze data points. The model is designed to comply with all ESD, RF and Emission standards and can be used in a wide temperature range from -20°C to +150°C. Additionally, it is capable of scanning up to 2000 wafers per hour and can be used for in-line or off-line operations as per the requirements. In conclusion, TENCOR OMNIMAP RS-55T/C provides a complete solution for wafer testing and metrology, providing accurate and repeatable results, and is suitable for multiple applications. It is highly reliable, cost effective and easy to use equipment.