Used KLA / TENCOR / PROMETRIX Omnimap RS-55TC #9194017 for sale
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Wafer Size: 8"
Four point probe resistivity mapping system, 8" Manual wafer handling Provides contour maps 3-D Plots Diameter scans Sheet resistance measurements Ambient temperature and materials Temperature Compensation (TC): Temperature variations Impact sheet Resistance measurements: 1% / Degree Temperature variations Dramatic effect Long-term repeatability Accuracy System-to-system matching Power supply: 115 V, 50/60 Hz.
KLA / TENCOR / PROMETRIX Omnimap RS-55TC is a high-end wafer testing and metrology equipment that's used to resolve adhesion, surface, and flatness problems in semiconductor testing. It's primarily used in the fabrication of microchips for various applications. The system utilizes patent-pending Multi-Reflection Suppression (MRS) optics to provide a superior image for lower-contrast samples. This is used to measure material properties such as thickness, width, depth, and flatness of wafer surfaces. It also has a dynamic focus drive that maintains the focus of the images throughout the testing process, and an Integrated Diagnostics Unit (IDS) to monitor and calibrate the imaging and metrology systems before taking measurements. Other features of KLA OMNIMAP RS-55/TC include an automated wafer handling machine that's capable of mounting, loading, and unloading wafers for testing, and a high-resolution 5-megapixel MISA™ imaging tool with panaromic lens. It also has a dual-beam videometer for acquiring test images quickly, and a process control asset to monitor and tune any process variables. The model is also designed to provide accurate and reliable test results with excellent repeatability and reproducibility with the help of electron optics. It has an automatic alignment feature, which allows it to quickly and accurately compensate for stage pitch, roll, and yaw while testing. It is also designed with a number of user-friendly features, such as an intuitive graphical user interface (GUI) and an access cover that makes it easier for technicians to reach and adjust components for testing. In addition to the features mentioned above, TENCOR OMNIMAP RS-55T/C equipment has a low-cost alternative to laser-based metrology. It also offers a high yield with a good signal-to-noise ratio for fast and reliable results. The system offers superior performance and accuracy, and can easily stand up to the rigors and demands of the semiconductor industry. It is also designed with safety and compatibility in mind and is compatible with the majority of standard microchips available today.
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