Used KLA / TENCOR / PROMETRIX Omnimap RS-55TC #9263096 for sale

KLA / TENCOR / PROMETRIX Omnimap RS-55TC is a wafer testing and metrology equipment designed to perform accurate, repeatable measurements on a wide variety of materials, including semiconductor devices. The RS-55TC features a powerful optical microscope, enabling high-resolution measurements of device features, as well as the ability to detect and analyze defects. The RS-55TC's platform includes a large, stable stage with a high-resolution, X-Y-Z scan system and a high-resolution, rotational scan stage for non-contact measurements of wafer die, micro-disks, and other substrates. In addition, the unit is equipped with a sophisticated sample positioning machine, allowing for precise alignment and positioning of probe points. The RS-55TC utilizes an advanced laser interferometry tool to measure surface abnormalities with an unprecedented accuracy of 30 nanometers, as well as enabling measurements of critical parameters such as film thickness, step height deviation, and line width variation. The RS-55TC asset has built-in intelligent diagnostics, allowing for reliable detection of potential outliers and faulty components, as well as ensuring a high yield rate of tested wafers. Integrated software for data acquisition, analysis, and reporting is included with the model, offering expanded capabilities for metrology and performance assurance. The equipment can be coupled with other KLA systems for additional monitoring capabilities, as well as linked to other control systems for ultimate flexibility and comprehensive automated process control. KLA OMNIMAP RS-55/TC is an advanced wafer testing and metrology system, offering unsurpassed accuracy and repeatability for measuring device features and analyzing defects. Its flexible platform, combined with its integrated software, provides users with a comprehensive test, measurement, and data gathering unit, all of which are necessary prerequisites for process optimization and performance assurance.