Used KLA / TENCOR / PROMETRIX Omnimap RS-55TCA #293605693 for sale

KLA / TENCOR / PROMETRIX Omnimap RS-55TCA is a wafer testing and metrology equipment used for wafer-level QC and yield management. This system offers an integrated, non-contact wafer-level inspection, measurement, and analysis solution. It offers unsurpassed speed, precision, accuracy, repeatability, and throughput to deliver the highest performance levels and fast, cost-effective solutions for quality control and process development. The RS-55TCA features a high-resolution, 1µm pixel camera, allowing detailed visualization of small features with razor-sharp clarity. This unit also features an advanced light-source arrangement and laser registration machine, enabling wafer-level alignment visualization and measurements with unsurpassed accuracy and repeatability. Its advanced motor drive and fast referencing, mapping, and measurement tool allows for streamlined, efficient operation and powerful throughput. The RS-55TCA is designed for high-precision measurement and analysis, with a wide array of options to enable scans and custom measurement solutions. This asset supports the analysis of multiple parameters such as particle size, particle count, micro-critical dimension (CD) line width and spacing, and dielectric thickness. It also supports the analysis of high-density Metal lines using advanced scanners with 25nm pitch capabilities. The intuitive user interface of the RS-55TCA provides easy access to multiple functions, including automated setup and visualization, user-defined setup and measurements, and powerful data analysis and reporting capabilities. It features an automated defect classification model to simplify defect reporting, as well as customizable report formats for specific customer requirements. Additionally, this equipment includes powerful data management tools to enable efficient data storage, retrieval, and transfer. The RS-55TCA offers a comprehensive set of wafer test and metrology tools to ensure the highest quality results. It provides reliable solutions for difficult process and product development challenges, while minimizing downtime and reducing costs. As such, this system is a powerful and cost-effective choice for wafer testing and metrology operations.