Used KLA / TENCOR / PROMETRIX Omnimap RS-75 #293622730 for sale

KLA / TENCOR / PROMETRIX Omnimap RS-75 is a high-performance wafer testing and metrology equipment specifically designed for high-density flat panel displays. KLA Omnimap RS-75 improves yield, accuracy, and process control by providing comprehensive imaging and metrology capabilities including measurement of biosensor, LED, nanotechnology and FTIR fluorescent structures. This system complies with industry standards and requirements to ensure reliable and consistent data quality. TENCOR OMNIMAP RS75 unit consists of an area-scanning head mounted on a robotic arm and an X-Y stage capable of translating objects up to 450mm in adjacent axes. The area-scanning head consists of optics, illumination, and detectors. Optics include two apertures to avoid cross-talk between detector channels and allow for easy alignment. Illumination consists of two-stage LED sources with programmable intensity and wavelength settings, providing improved efficiency and flexibility. The LED sources are tuned for flat panel display applications. PROMETRIX OMNIMAP RS75 machine is equipped with two high-speed digital cameras for imaging and an optical encoder for high-accuracy measurements. It also has an integrated tool controller to configure, control and automate the tool with up to 16 stepping motors. The Autofocus feature automatically maintains optimal camera focus and focus depth, even in difficult samples, ensuring high scanning accuracy and image quality. KLA OMNIMAP RS75 asset includes software for data acquisition and control, as well as professional software for 3D reconstruction and analysis. The easy-to-use software is highly intuitive and provides powerful visualization, analysis, and mobile reporting capabilities. The software provides a full array of data analysis and process control capabilities, enabling users to quickly identify potential issues and optimize product performance. TENCOR Omnimap RS-75 model is designed to handle a wide range of wafer-level metrology applications and is capable of imaging 50mm, 75mm and 300mm wafers in nanometer to millimeter scales. The equipment is designed to handle high-speed and fast scanning modes, providing reliable and high-precision characterization. It also offers a wide range of capabilities for bitmap, Functional Test, Inspection, Metrology, Measurement and See-through Imaging for flat panel displays applications. PROMETRIX Omnimap RS-75 system is highly reliable and offers repeatable and highly-accurate wafer inspection and metrology solutions.