Used KLA / TENCOR / PROMETRIX Omnimap RS-75 #9190988 for sale
It looks like this item has already been sold. Check similar products below or contact us and our experienced team will find it for you.
Tap to zoom
Sold
ID: 9190988
Vintage: 1997
Resistance mapping system
Measurement range: <5 mΩ/sq - >5MΩ/sq
Appropriate probe head: <0.2% (1σ)
Manually loaded single wafer: ≤60 seconds
Typical measurement time: 49-site test
Measurement capabilities:
Routine check: 1-30 sites programmable (ASTM standard tests included)
XY Map: 1,200 sites programmable
Single/Dual configuration capability
Analysis capabilities:
Contour/3D map: 49, 81, 121, 225, 361, 441, 625 sites
Diameter scan: 49, 81, 121, 225, 361, 441, 625 sites
Probe qualification test: 20 sites, programmable radius
Calibration curves for low-dose monitoring
File editing/data extraction capability
Average difference/ratio maps
Trend/SQC charts
Histograms
Data transfer: SECS II/RS232 Communication (Data upload)
Precision probe heads:
40 mil Probe spacing: 100 gm loading
Tip radius: 1.6, 4, 8 and 20 mil
25 mil Probe spacing: 100 gm loading
Tip radius: 1.6, 4, and 8 mil
62.5 mil Probe spacing: 200 gm loading
Tip radius: 1.6 mil
High-speed tester accommodates all standard wafer diameters
in thicknesses up to 2 mm: 2, 3, and 3.25 in; 100, 125, 150 and 200 mm
Includes:
High-resolution color monitor
1.4 MB, 3.5" floppy drive
Fixed hard drive
Line conditioner
EMO Circuitry
Pentium computer
1997 vintage.
KLA / TENCOR / PROMETRIX Omnimap RS-75 is an advanced wafer testing and metrology equipment designed with precision and speed. The system is capable of quickly and accurately performing non-destructive testing and metrology on wafers and other substrates. The state-of-the-art KLA Omnimap RS-75 features a high-resolution, anti-reflection coating video camera, which is used to observe and measure the surfaces and edges of a wafer. Its advanced optics and camera resolution provide clearer, more detailed images and accurate measurements. An advanced software package is provided to perform operations such as image analysis, image storing and image processing, allowing for quick and efficient inspections of the surface and edges of a wafer. In addition to its high-resolution, anti-reflection coating video camera, TENCOR OMNIMAP RS75 includes an extremely accurate, two-sided 100µm size resolution wafer sensor. This sensor offers a high level of precision and accuracy and is capable of scanning both sides of a wafer and can thus identify foreign particles, burrs, and surface irregularities. The unit is also equipped with configurable scan patterns, allowing for flexibility and ease of use. PROMETRIX Omnimap RS-75 also comes standard with a powerful scanning motor and a scan algorithm. This enables the machine to precisely scan substrates both in x-y-z axes and rotate the substrate around the z-axis. This allows for fast and efficient analysis and processing, providing a comprehensive evaluation of the substrate. The flexibility and accuracy of TENCOR Omnimap RS-75 makes it an exceptional wafer testing and metrology tool. Its advanced configurations and features make it the perfect choice for industrial quality control and inspection operations. The asset's intuitive interface makes it easy to use, providing organizations with an efficient and reliable wafer testing and metrology model.
There are no reviews yet