Used KLA / TENCOR / PROMETRIX Omnimap RS-75 #9365988 for sale

KLA / TENCOR / PROMETRIX Omnimap RS-75 is a wafer testing and metrology equipment designed specifically for the semiconductor industry. The system provides accurate and reliable measurement of wafer topography, defects, and other crucial parameters. It is capable of sophisticated testing on large-format wafers, while also providing highly detailed mapping of optically transparent films. The key components of KLA Omnimap RS-75 unit are the integrated acquire and measure hardware platform, the advanced imaging machine, and powerful, yet easy-to-use software. The hardware platform consists of a scanner, a computer, and the necessary tool components. The scanner features a three-axis X-Y-Z stage, enabling precise movements for detailed characterization of wafers. The computer runs the advanced imaging asset, which couples sophisticated algorithms with high-resolution optics for accurate and repeatable results. The software that comes with TENCOR OMNIMAP RS75 model is tailored to the requirements of the semiconductor industry. It provides fast, efficient data processing, advanced data analysis, and advanced feature recognition capabilities. The software also offers powerful options for the visualization and visualization tools, allowing users to quickly assess the results of their measurements. Omnimap RS-75 is designed to provide an efficient and reliable testing solution for non-Gaussian data. It uses parameters such as radius of curvature, step height, and spatial drift to accurately measure films. Its advanced imaging technology also enables precise defect inspection in films, while its advanced feature recognition capability provides high-resolution defect characterizations for applications such as defects in thin films and contact metrology. KLA also offers a suite of calibration options specially designed for KLA / TENCOR / PROMETRIX OMNIMAP RS75 equipment. These calibration options provide high accuracy and repeatability, enabling the system to meet the most stringent industry standards. To ensure data integrity, PROMETRIX Omnimap RS-75 automatically stores calibration results for the user's reference. PROMETRIX OMNIMAP RS75 is an advanced wafer testing and metrology unit designed to provide industry-leading performance in the semiconductor industry. It features an integrated acquire and measure hardware platform, powerful and easy-to-use software, and a suite of calibration options. The machine provides accurate and reliable measurements, enabling users to confidently assess the results of their wafer testing and metrology activities.