Used KLA / TENCOR / PROMETRIX Omnimap RS #9148331 for sale

KLA / TENCOR / PROMETRIX Omnimap RS is a state-of-the-art wafer testing and metrology equipment that is used in the semiconductor industry. This system allows for automated, high-accuracy measurements of critical device parameters, including critical dimension (CD), overlay, critical electrical parameters, and other wafer-level characteristics. KLA Omnimap RS operates in real time, making it extremely efficient for production processes. The unit houses a compact, high performance, confocal imaging subsystem that is used for a variety of applications. It has an optical assembly composed of an objective and a programmable laser. The laser is capable of high-precision beam scanning and image acquisition through the microscope's objective lenses. The resulting data is used for both inline and offline wafer testing and analysis. TENCOR Omnimap RS is equipped with a number of features that make the testing and metrology process more efficient and accurate. User friendly front end software is used to streamline operations and measurement accuracy. The machine also offers automated control, including feature recognition and defect detection algorithms, which significantly reduce misclassification of defects. The tool also features high resolution imaging and live imaging capabilities. This provides users with accurate real-time analysis of wafers, ensuring that device parameters are measured accurately and quickly. In addition, Omnimap RS has an advanced edge detection filter that increases edge accuracy. PROMETRIX Omnimap RS is an effective wafer testing and metrology asset. It can assess device parameters quickly and accurately, making it an ideal tool for production processes. The model's cutting edge imaging, advanced feature recognition and defect detection algorithms provide users with an efficient and accurate testing and metrology solution that is ideal for the semiconductor industry.