Used KLA / TENCOR / PROMETRIX Omnimap RS-75 #9115873 for sale
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KLA / TENCOR / PROMETRIX Omnimap RS-75 is a powerful and precise wafer testing and metrology equipment. It is an automated metrology system that provides a comprehensive suite of measurement, analysis, and reporting capabilities with a high degree of accuracy. It is designed to measure and analyze the profile, surface finish, and dimensional features of semiconductor wafers, and to provide a detailed inspection report with the results. KLA Omnimap RS-75 is ideal for wafer lithography, wafer probing, particle counting, gap analysis, edge analysis, and critical dimension (CD) measurement. It is an integrated unit with individual testing and metrology elements including an optical microscope, a scanning electron microscope (SEM), a scatterometer, a drop size analyzer, and a kinematic field-of-view sensor. These elements are combined in an efficient, high-precision configuration that can be used to quickly assess individual wafers and process quality. The machine's high-resolution imaging capability allows for detailed imaging of wafer features. Additionally, it has a large field of view, which allows for more complete testing of multiple wafers at once. The SEM is capable of high magnification and can be used for in-depth analysis of features as small as 10 nanometers in size. The precision scatterometer is able to detect small variations in wafer thickness, while the drop size analyzer is capable of studying minuscule variations in particle size and shape. The kinematic field-of-view sensor provides precise size measurements for wafer-to-wafer comparison. TENCOR OMNIMAP RS75 includes a comprehensive data analysis package that enables users to quickly assess and interpret the data collected during the testing and metrology process. The tool generates detailed graphics and reports that provide an insight into wafer processing and performance. The data can also be used in process optimization and characterization. PROMETRIX OMNIMAP RS75 is robust and reliable, with an intuitive user interface that makes it easy to set up and operate. The asset is also customizable and can be configured to meet a wide range of needs, depending on the requirements of the wafer testing and metrology process. The combination of precision, speed, and reliability make PROMETRIX Omnimap RS-75 an excellent choice for wafer testing and metrology.
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