Used KLA / TENCOR / PROMETRIX Omnimap RS-75 #9162058 for sale

KLA / TENCOR / PROMETRIX Omnimap RS-75 is a high-performance wafer testing and metrology equipment that is designed for precision surface inspections and process characterization of wafers. It combines an advanced automated optical inspection (AOI) equipment with sophisticated integrated metrology for precise wafer-level measurements. The RS-75 can measure with an accuracy of better than one micron (1μm), making high resolution imaging and measurements possible for a variety of wafer materials and substrate types. The RS-75 is a rapid, large area surface analysis system that combines multiple metrology technologies into one platform. It is equipped with a five-axis wafer stage that can be managed from the integrated controls for a wide range of applications. The five-axis motion and high-precision metrology methods enable scanning and inspection of large areas of wafers at high speed. It also ensures a rapid and accurate measurement of any irregular features, such as scratches, pits, or stains, with the integration of advanced optical and profilometric imaging. For surface inspection, the RS-75 employs an efficient bright field imaging technology with sophisticated optics. It is capable of capturing images in various configurations with a maximum resolution up to 5µm. Moreover, the multistage illumination unit enables transmission, oblique, reflectance, and scattered pattern inspections that can detect a variety of features and defects. The RS-75 is also an advanced metrology platform providing a variety of tools for precision dimensional metrology. It comes with a non-contact 3DPro spectroscopic technology that uses light reflectance to measure surface profiles with high precision. The omnidirectional and non-contact technology also enables 3D reconstruction of the surfaces of the wafer for further analysis. The RS-75 also features a wide range of software tools for data acquisition, processing, and analysis. Apart from the automatic feature recognition and pattern comparison, the software can also generate reports automatically for the analysis conveniently. Overall, KLA Omnimap RS-75 is a powerful wafer testing and metrology machine that is designed for high precision surface inspections and process characterization. It comes with advanced imaging and metrology methods, along with software tools for automated feature recognition and reporting. It is an ideal platform for wafer manufacturers for their quality control and process development.