Used KLA / TENCOR / PROMETRIX P-20H #293594524 for sale

KLA / TENCOR / PROMETRIX P-20H is a state-of-the-art wafer testing and metrology equipment designed to inspect wafers, both front and back side, on a microscopic level. This system boasts a high optical resolution, leading to accurate and fast non-destructive measurements. KLA P-20H includes a unique peripheral and patterned wafer mapping unit, allowing for the topographical mapping of not just the surfaces, but also the physical features, of the wafers. It features two-sided inspection, with both surface and patterned metrology capability from either side of the wafer. Additionally, TENCOR P20H has advanced features such as automated defect identification, defect categorization, and metrology analysis, allowing for more efficient and accurate analysis of wafers. PROMETRIX P-20H is fueled by advanced proprietary algorithms and logical imaging, giving it the capability of providing 3D optical thickness and resistivity measurements of wafers, as well as the ability to recognize a wide range of defect types, such as particle defects, electrostatic discharge, and fabricated feature defects. TENCOR P-20H also utilizes advanced lighting and image acquisition technologies, including bright-field and dark-field illumination technology as well as P-20HCCD camera technology. KLA / TENCOR / PROMETRIX P20H's advanced scanning capabilities are combined with its advanced software user interface. Features include advanced data management, recipe control, statistical defect classification, and its report generator which summarizes all findings into an easy-to-read format. It also has graphical image editing capabilities, allowing for the manual identification of defects on the user's own devices. This machine is housed in a cleanroom-compatible enclosure, providing a low-noise and dust-free environment for wafer testing and metrology. This environment is protected with a variety of advanced dust filter technologies, as well as an airborne particle detection tool, further isolating the wafer from dust particles to ensure accurate measurements from P20H. Overall, P-20H is a best-in-class wafer testing and metrology asset, producing high-quality, fast, and accurate measurements while ensuring a dust-free and low noise environment. It combines advanced technologies, optical resolution, software user interface, and graphical imaging editing capabilities to provide the user a reliable, dependable model.