Used KLA / TENCOR / PROMETRIX P-20H #9101209 for sale

KLA / TENCOR / PROMETRIX P-20H equipment is a high-throughput wafer testing and metrology system that provides a total solution for advanced defect review, wafer defect reporting, and improved device performance characterization. KLA P-20H provides superior precision wafer and packaged device metrology with advanced defect review capabilities to facilitate process validation and yield improvement. TENCOR P20H is capable of supporting various wafer diameters of up to 300mm with resolution up to 1µm, 3D non-contact profilers, spectroscopic imaging systems, optical lithography tools, interferometry and scatterometry solutions, as well as high-density defect inspection and throughput. The unit has a maximum throughput of up to 461 wpm, and supports multiple wafer patterns, including planar, via, wire-bond, and double-side. The machine also features advanced defect review tools, allowing users to quickly isolate and categorize defects in order to evaluate processes, determine root causes, and improve yields and process control. P-20H supports automated review processes, as well as manual review of complex structures such as multi-plane test structures and advanced FIB sample preparation. Additionally, the tool is capable of wafer-level metrology for packaged devices and MEMS devices, providing quick feedback on performance. The asset is equipped with an intuitive user interface that allows users to quickly set up new projects, review results, and run reports. Additionally, the model includes software tools to enable users to quickly analyze data and generate graphs for review. The equipment is also capable of integrating with third-party components such as review stations and defect classification systems. In summary, PROMETRIX P20H is a high-throughput wafer testing and metrology system designed to provide superior precision and advanced defect review capabilities for process validation and yield improvement. The unit allows for multi-plane wafer patterning, defect review, and packaged device characterization with a throughput of up to 461 wpm. In addition, the user-friendly software makes it easy to quickly set up experiments and analyze results. Finally, the machine can also be integrated with other components, providing an effective total solution for wafer testing and metrology needs.