Used KLA / TENCOR / PROMETRIX P-20H #9150863 for sale

ID: 9150863
Surface profiler.
KLA / TENCOR / PROMETRIX P-20H is a state-of-the-art wafer testing and metrology equipment designed to provide precise and accurate measurements and analysis of semiconductor wafers. This system features a pneumatically actuated pattern recognition stage to guarantee automatic alignment of wafers for precise testing and scanning. It is also equipped with a high-speed 4-axis positioning unit that can achieve very precise motion control for wafer scanning and testing requirements. Additionally, the machine is designed to tolerate a wide variety of wafer sizes and configurations and is capable of collecting data from different areas on the wafer surface. KLA P-20H tool includes a host of metrology options, such as film thickness measurements, wafer warpage measurements, resistivity measurements, contact resistance measurements, wafer edge measurements, and imaging. It also features a variety of additional measurement options, such as particle scanning, topography analysis, and stress mapping for more in-depth testing and analysis. The inspect area is capable of accommodating up to thirty two 6-inch wafers, which can be tested and scanned quickly and simultaneously. The asset's user interface is designed to facilitate easy operation and feature intuitive setup and monitoring. Additionally, the model can be operated remotely and integrated with other control systems. The user interface is also tailored to the detection of failure points quickly and accurately. It allows for the collection of data logs and the measurement of the position of the wafers for more detailed analyses and reporting results. TENCOR P20H equipment is designed to provide reliable and accurate testing and metrology results even at the highest possible throughput rates. It is also equipped with advanced safety features to ensure that wafer testing is carried out safely and securely. Furthermore, it is built to meet ISO 9000 standards, which means that it allows for greater traceability of the data being collected and processed. Overall, KLA P20H wafer testing and metrology system is a powerful and reliable tool for precise testing and data gathering from semiconductor wafers. Its intuitive user interface and various testing capabilities make it an ideal choice for any application requiring detailed and accurate data at high throughput rates.
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